Analytic apparatus
分析儀器
A field-emission scanning electron microscope (FESEM, JOEL, JSM-6500F) equipped with an energy dispersive X-ray spectrometer (EDS, Oxford Instrument INCA x-sight 7557).
場發射掃描電子顯微鏡,配裝能量分佈 X 光光譜儀
場發射掃描電子顯微鏡,配裝能量分佈 X 光光譜儀
An ambient scanning tunneling microscope (STM, Nanosurf) with an I-V measurement function.
大氣下掃描穿透顯微鏡,搭配 I-V 量測功能
An ambient scanning probe microscope (SPM, NTMDT) with full functions, such atomic force microscopy (AFM), magnetic force microscopy (MFM), capacitance force microscopy (CFM), IV measurement, and force spectroscopy.
大氣下全功能掃描探針顯微鏡,具有原子力顯微鏡、磁力顯微鏡、電容力顯微鏡、 I-V 量測功能、與力譜儀
大氣下全功能掃描探針顯微鏡,具有原子力顯微鏡、磁力顯微鏡、電容力顯微鏡、 I-V 量測功能、與力譜儀
A field-emission spectrometer (homemade) with a high vacuum chamber of 1x10^-7 Torr.
自製場發射譜儀,高真空可至 1x10^-7 Torr
自製場發射譜儀,高真空可至 1x10^-7 Torr