Analytic apparatus

分析儀器

 A field-emission scanning electron microscope (FESEM, JOEL, JSM-6500F) equipped with an energy dispersive X-ray spectrometer (EDS, Oxford Instrument INCA x-sight 7557).
場發射掃描電子顯微鏡，配裝能量分佈 X 光光譜儀

An ambient scanning tunneling microscope (STM, Nanosurf) with an I-V measurement function.

大氣下掃描穿透顯微鏡，搭配 I-V 量測功能 

 An ambient scanning probe microscope (SPM, NTMDT) with full functions, such atomic force microscopy (AFM), magnetic force microscopy (MFM), capacitance force microscopy (CFM), IV measurement, and force spectroscopy.
大氣下全功能掃描探針顯微鏡，具有原子力顯微鏡、磁力顯微鏡、電容力顯微鏡、 I-V 量測功能、與力譜儀

 A field-emission spectrometer (homemade) with a high vacuum chamber of 1x10^-7 Torr.
自製場發射譜儀，高真空可至 1x10^-7 Torr